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非接触式测厚仪

Industry category: Precision Optics, Lens & Camera Module Expo

Product range: Optical Imaging Measurement/

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美国Lumetrics研发的高精度非接触式测厚仪,采用白光干涉原理,可快速测量12μm-80mm透光材料的厚度,精度为0.1μm,测单层和多层厚度(20层),可选多探头配置,内部自校准,NIST追溯。

OPCROWN PHOTONICS COMPANY LIMITED

Hall:Hall 5

Booth No:5C65